Compartir
Radiation Induced Fault Detection, Diagnosis, and Characterization on FPGAs (en Inglés)
Thomas B. Getz
(Autor)
·
Biblioscholar
· Tapa Blanda
Radiation Induced Fault Detection, Diagnosis, and Characterization on FPGAs (en Inglés) - Getz, Thomas B.
$ 48.80
$ 57.95
Ahorras: $ 9.15
Elige la lista en la que quieres agregar tu producto o crea una nueva lista
✓ Producto agregado correctamente a la lista de deseos.
Ir a Mis ListasSe enviará desde nuestra bodega entre el
Lunes 08 de Julio y el
Martes 09 de Julio.
Lo recibirás en cualquier lugar de Estados Unidos entre 1 y 3 días hábiles luego del envío.
Reseña del libro "Radiation Induced Fault Detection, Diagnosis, and Characterization on FPGAs (en Inglés)"
The development of Field Programmable Gate Arrays (FPGAs) has been a great achievement in the world of microelectronics. One of these devices can be programmed to replace the need for thousands of individual specialized devices. Despite their great versatility, FPGAs are still extremely vulnerable to radiation from cosmic waves in space. Extensive research has been conducted to examine how radiation disrupts FPGAs. This research incorporates and enhances current methods of radiation detection. A design is created that has the ability to detect flipped bits and delay errors caused by radiation along with their location, amount and duration. All of this is accomplished and reported in real time. The design requires more testing, but once that is done this system can be incorporated with FPGA reconfiguration methods that automatically place application logic away from failing errors of the FPGA. This system has great potential to become a valuable tool in fault mitigation.
- 0% (0)
- 0% (0)
- 0% (0)
- 0% (0)
- 0% (0)
Todos los libros de nuestro catálogo son Originales.
El libro está escrito en Inglés.
La encuadernación de esta edición es Tapa Blanda.
✓ Producto agregado correctamente al carro, Ir a Pagar.
